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0
索取号：TN432-53/E901/1984
作者：IEEE Gallium Arsenide Integrated Circuit Symposium. (1984 : Boston、 Mass.)、IEEE Electron Devices Society.、IEEE Microwave Theory and Techniques Society.、
出版社：Piscataway, N.J. (445 Hoes Lane, Piscataway) : Copies may be obtained from Institute of Electrical and Electronics Engineers, c1984.
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0
索取号：TN4-53/E804/1976
作者：International Microelectronics Symposium (1976 : Vancouver、 B.C.)、International Society for Hybrid Microelectronics.、
出版社：Montgomery, Ala. : International Society for Hybrid Microelectronics, c1976.
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0
索取号：TN4-53/E804/1978
作者：International Microelectronics Symposium (1978 : Minneapolis、 Minn.)、International Society for Hybrid Microelectronics.、International Society for Hybrid Microelectronics. Technical Program Committee.、
出版社：Montgomery, Ala. (P.O. Box 3255, Montgomery, Ala. 36109) : The Society, c1978.
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0
索取号：TN4/E704/2
作者：Symposium on Hybrid Microelectronics (2nd : 1967 : Boston、 Mass.)、Woulbroun、 John M.、 1932-、Doyle、 George A.、IEEE Parts、 Materials、 and Packaging Group. Boston Chapter.、International Society for Hybrid Microelectronics.、
出版社：[Palo Alto] : International Society for Hybrid Microelectronics; [obtained from Western Periodicals Co., North Hollywood, Calif., 1967].
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索取号：TN304.23-53/E701/1966
作者：
出版社：London : Institute of Physics & the Physical Society, 1967].
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索取号：TN304.07-53/E801/1973
作者：Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、
出版社：New York : IEEE, c1973.
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索取号：TN27-53/E801
作者：Symposium on Current Mathematical Problems in Image Science (1976 : Monterey、 Calif.)、Wilde、 Carroll O.、Barrett、 Eamon.、
出版社：North Hollywood, Calif. : Western Periodicals Co., 1977.
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0
索取号：TN249-53/E805/1975
作者：LDA-Symposium、 Technical University of Denmark、 1975.、Buchhave、 Preben.、Copenhagen. Polyteknisk l´reanstalt.、
出版社：Skovlunde : Proceedings LDA-Symposium Copenhagen 1975, 1976.
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0
索取号：TN14-53/E801/11
作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、
出版社：San Francisco, Calif. : San Francisco Press, c1971.
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0
索取号：TN14-53/E801/10
作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、
出版社：San Francisco : San Francisco Press, [c1969].
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索取号：TN1-53/E906
作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、
出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
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索取号：TN06-53/E802/1970
作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、
出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.
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0
索取号：TN06-53/E801/11
作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0
索取号：TN06-53/E801/10
作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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0
索取号：TN06-53/E801/9
作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
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0
索取号：
作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、
出版社：Philadelphia, PA : ASTM, c1990.
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